Future Work
nImprove Device Characteristics
nThinner Films
nMore Dispersed Tubes
nSeparate Semiconducting and Metallic Tubes
nMobility vs. applied pressure
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nImprove Probe Station
nTrue AC Setup
nGold Pogo Pin probe/Micrometer positioner
nTemperature/Humidity Control Chamber

nCharacteristics vs. Network Density
nPhoto-lithographic Mask for micro scale geometries
nStudy 2-D Percolation problem of random array of  semiconducting rods
nE-Beam Lithography for nano scale geometries

nProtein detection

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