Publications

  1. H. Jiang, D. Ramuno-Johnson, C.Song, B. Amirbekian, Y. Kohmura, Y.Nihshino, Y. Takahashi, T. Ishikawa and J. Miao, “Nanoscale Imaging of Mineral Crystals inside Biological Composite Materials Using X-ray Diffraction Microscopy” Phys. Rev.Lett. 100, 038103 (2008).
  2. C. Song, R. Bergstrom, D. Ramuno-Johnson, H. Jiang, D. Paterson, M.D. de Jonge, I. McNulty, J.Lee, K. Wang and J. Miao, “Nanoscale Imaging of Buried Structures with Elemental Specificity by Using Resonant X-ray Diffraction Microscopy” Phys. Rev.Lett. 100, 025504 (2008).
  3. R.L. Sandberg, C. Song, P.W. Wachulak, D.A. Raymondson, A. Paul, B. Amirbekian, e. Lee, A.E. Sakdinawat, M.C. Marconi, C.S. Menomi, M.M. Murnane, J.J. Rocca, H.C. Kapteyn, J. Miao, “High Numerical Aperture Tabletop Soft X-ray Diffraction Microscopy with 70 nm Resolution” Proc. Natl. Acad. Sci. USA 105, 24-27 (2008). [Highlighted in Nature Photonics 2, 64 (2008)]
  4. J. Miao, T. Ishikawa, T. Earnest and Qun Shen, “Extending the Methodology of X-ray Crystallography to Allow Structure Determination of Non-Crystalline Materials, Whole Cells and Single Macromolecular Complexes”” (Invited Review) Annu. Rev. Phys. Chem. 59, 24-27 (2008).
  5. R.L. Sandberg, A. Paul, D. Raymondson, S. Hädrich, D. Gaudiosi, J. Holtsnider, R. Tobey, O. Cohen, M.M. Murnane, H.C. Kapteyn, C. Song, J. Miao, Y. Liu and F. Salmassi, “Lensless diffractive imaging using tabletop, coherent, high harmonic soft x-ray beams” Phys. Rev. Lett. 99, 098103 (2007).[Highlighted in a News and Views Article in Nature 449, 553-554(2007)]
  6. C. C. Chen, J. Miao, C.W. Wang, and T.K. Lee, “Application of the optimization technique to non-crystalline X-ray diffraction microscopy - Guided Hybrid Input-Output Method (GHIO)” Phys. Rev. B. 76, 064113 (2007).
  7. C. Song, D. Ramunno-Johnson, Y. Nishino, Y. Kohmura, T. Ishikawa, C.C. Chen, T.K. Lee and J. Miao, “Phase Retrieval from Exactly Oversampled Diffraction Intensity Through Deconvolution” Phys. Rev. B. 75, 012102 (2007).
  8. J. Miao, C.C. Chen, C. Song, Y. Nishino, Y. Kohmura, T. Ishikawa, D. Ramunno-Johnson, T.K. Lee and S.H. Risbud, “Three-Dimensional GaN-Ga2O3 Core Shell Structure Revealed by X-ray Diffraction Microscopy” Phys. Rev. Lett. 97, 215503 (2006).
  9. Y. Nishino, J. Miao, Y. Kohmura, Y. Takahashi, C. Song, B. Johnson, M. Yamamoto, K. Koike, T. Ebisuzaki and T. Ishikawa, “Hard X-ray Diffraction Microscopy at SPring-8”, in Proceedings of the 8th International Conference on X-ray Microscopy, eds. by S. Aoki, Y. Kagoshima and Y. Suzuki, pp. 386-388 (2006).
  10. Y. Kohmura, Y. Nishino, T. Ishikawa and J. Miao, “Effect of Distorted Illumination Waves on Coherent Diffraction Microscopy”, in Proceedings of the 8th International Conference on X-ray Microscopy, eds. by S. Aoki, Y. Kagoshima and Y. Suzuki, pp. 414-416 (2006).
  11. Y. Kohmura, Y. Nishino, T. Ishikawa and J. Miao, “Effect of Fresnel Illumination on Oversampling Iteration Method”, J. App. Phys. 98, 123105 (2005).
  12. J. Miao, Y. Nishino, Y. Kohmura, B. Johnson, C. Song, S.H. Risbud, T. Ishikawa, “Quantitative Image Reconstruction of GaN Quantum Dots from Oversampled Diffraction Intensities Alone” Phys. Rev. Lett. 95, 085503 (2005).
  13. J. Miao, F. Förster and O. Levi, “Equally Sloped Tomography with Oversampling Reconstruction”, Phys. Rev. B. 72, 052103 (2005).
  14. J. Miao, C. Song, Y. Nishino, Y. Kohmura, B. Johnson and T. Ishikawa, “3D Microscopy Provides the First Deep View”, IEEE Tech Digest Tranducers’s05, pp. 1304-1305 (2005).
  15. I. K. Robinson and J. Miao, “Three Dimensional Coherent X-ray Diffraction Microscopy”, MRS Bulletin 29, 177-181 (2004).
  16. J. Miao, H. N. Chapman, J. Kirz, D. Sayre and K. O. Hodgson, “TTaking X-ray Diffraction to the Limit: Macromolecular Structures from Femtosecond X-ray Pulses and Diffraction Microscopy of Cells with Synchrotron Radiation”, Annu. Rev. Biophys. Biomol. Struct. 33, 157-176 (2004).
  17. Y. Nishino, J. Miao and T. Ishikawa, “Image Reconstruction of Nanostructured Non-Periodic Objects Only from Oversampled Hard X-ray Diffraction Intensities”, Phys. Rev. B (Rapid Commun.) 68, 220101 (2003).
  18. G.S. Edwards, R.H. Austin, F.E. Carroll, M.L. Copeland, M.E. Couprie, W.E.Gabella, R.F. Haglund, B.A. Hooper, M.S. Hutson, E.D. Jansen, K.M. Joos, D.P. Kiehart, I. Lindau, J. Miao, H.S. Pratisto, J.H. Shen, Y. Tokutake, L. van der Meer and Aihua Xie, “Free-electron-laser-based biophysical and biomedical instrumentation”, Rev. Sci. Instru. 74, 3207-3245 (2003).
  19. J. Miao, J. Amonette, Y. Nishino, T. Ishikawa and K. O. Hodgson, “Direct Determination of the Absolute Electron Density of Nanostructured and Disordered Materials at Sub-10 nm Resolution”, Phys. Rev. B 68, 012201 (2003).
  20. J. Miao, T. Ishikawa, E. H. Anderson and K. O. Hodgson, “Phase Retrieval of Diffraction Patterns from Non-Crystalline Samples”, Phys. Rev. B 67, 174104 (2003).
  21. J. Miao, K. O. Hodgson, T. Ishikawa, C. A. Larabell, M. A. LeGros and Y. Nishino, “Imaging Whole Escherichia Coli Bacteria by Using Single Particle X-ray Diffraction”, Proc. Natl. Acad. Sci. USA 100, 110-112 (2003).
  22. J. Miao, T. Ohsuna, O. Terasaki, K. O. Hodgson and M. A. O’Keefe, “Atomic Resolution Three-Dimensional Electron Diffraction Microscopy”, Phys. Rev. Lett. 89, 155502 (2002).
  23. J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai and K. O. Hodgson, “High Resolution 3D X-ray Diffraction Microscopy”, Phys. Rev. Lett. 89, 088303 (2002). (Cover Story)
  24. J. Miao, K. O. Hodgson and D. Sayre, “A New Approach to 3-D Structures of Biomolecules Utilizing Single Molecule Diffraction Images”, Proc. Natl. Acad. Sci. USA 98, 6641-6645 (2001).
  25. J. C. H. Spence, M. Howells, L. D. Marks and J. Miao, “Lensless imaging: a workshop on new approaches to the phase problem for non-periodic objects”, Ultramicroscopy 90, 1-6 (2001).
  26. B. Winn, H. Ade, C. Buckley, M. Feser, M. Howells, S. Hulbert, C. Jacobsen, K. Kaznacheyev, J. Kirz, A. Osanna, J. Maser, I. McNulty, J. Miao, T. Oversluizen, S. Spector, B. Sullivan, Y. Wang, S. Wirick and H. Zhang, “Illumination for coherent soft X-ray applications: The new X1A beamline at the NSLS”, J. Synch. Rad. 7, 395-404 (2000).
  27. J. Miao and D. Sayre, “On possible extensions of X-ray crystallography through diffraction pattern oversampling”, Acta Cryst. A 56, 596-605 (2000).
  28. J. Miao, J. Kirz and D. Sayre, “The oversampling phasing method”, Acta Cryst. D 56, 1312-1315 (2000).
  29. D. Sayre, J. Miao, J. Kirz and P. Charalambous, “An extension of the methodology of X-ray crystallography allowing imaging of micron-size non-crystalline specimens”, in Proceedings of 2000 Erice conference on Methods in Macromolecular Crystallography (D. Turk, ed.).
  30. J. Miao, P. Charalambous, J. Kirz and D. Sayre, “An Extension of the Methodology of X-Ray Crystallography to Allow X-Ray Microscopy without X-Ray Optics”, in X-ray Microscopy, eds. by W. Meyer-Ilse, T. Warwick and D. Attwood, pp. 581-586 (2000).
  31. J. Miao, P. Charalambous, J. Kirz and D. Sayre, “Extending the methodology of X-ray Crystallography to Non-Crystalline Specimens”, in Synchrotron Radiation Instrumentation, eds. by P. Pianetta, J. Arthur, and S. Brennan, pp. 3-6 (2000).
  32. J. Miao, P. Charalambous, J. Kirz and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens”, Nature 400, 342-344 (1999).
  33. H. N. Chapman, S. Vogt, C. Jacobsen, J. Kirz, J. Miao, Y. Wang, B. Winn and T. Oversluizen, “A Shutter-Photodiode combination for UV and soft X-ray beamline”, J. Synch. Rad. 6, 50 (1999).
  34. J. Miao, D. Sayre and H. N. Chapman, “Phase Retrieval from the Magnitude of the Fourier transform of Non-periodic Objects”, J. Opt. Soc. Am. A. A 15, 1662-1669 (1998).
  35. D. Sayre, H. N. Chapman and J. Miao, “On the Extendibility of X-ray Crystallography to Non-crystals”, Acta Cryst. A 54, 232-239 (1998).
  36. J. Miao, H. N. Chapman and D. Sayre, “Image Reconstruction from the Oversampled Diffraction Pattern”, Microscopy and Microanalysis 3, supplement 2, 1155-1156 (1997).
  37. B. Winn, H. Ade, C. Buckley, M. Howells, S. Hulbert, C. Jacobsen, J. Kirz, I. McNulty, J. Miao, T. Oversluizen, I. Pogorelsky and S. Wirick, “X1A: Second Generation Undulator Beamline Serving Soft X-ray Spectromicroscopy Experiment at the NSLS”, Rev. Sci. Instru. 67, 3359 (1996).
  38. B. Winn, X. Hao, C. Jacobsen, J. Kirz, J. Miao, S. Wirick, H. Ade, C. Buckley, M. Howell, S. Hulbert, I. McNulty and T. Oversluizen, “Consideration for Soft X-ray Spectromicroscopy Beamline”, SPIE Proc. 2856, 100-109 (1996).
  39. N. V. Andronova, V. G. Kohn, A. I. Chechin, E. Tang, J. Miao and M. Cui, “Computer Simulation and Experimental Investigation of X-ray Multilayer Mirrors”, Nucl. Instru. Methods A 359, 135-137 (1995).
  40. M. Cui, J. Miao, J. Wang, Y. Huang, E. Tang, J. Shao, S. Xue, Z. Xu and J. Sun, “A Synchrotron Radiation Soft X-ray Reflectometer and Its Physical Results”, Nucl. Instru. Methods A 359, 151-154 (1995).
  41. L. Yuan, Z. Yin, J. Shao, K. Yi, M. Cui, J. Miao, L. Liu, G. Chen and X. Shen, “Diffractive Efficiency Study of Soft X-ray Multilayer Grating with Sub-micron Grating Period”, Acta Physica Sinica (in Chinese) 44, 184-188 (1995).
  42. J. Miao, M. Cui, J. Wang and E. Tang, “Study of Multilayer Mirror Reflectivity in the Soft X-ray Region”, Acta Physica Sinica (oversea edition) 4, 130-138 (1995).
  43. M. Cui, J. Wang, J. Miao, Y. Huang, E. Tang, D. Xian, J. Shao, S. Xue, Z. Xu and J. Su, “A Soft X-ray Reflectometer at the Beijing Synchrotron Radiation Facility and Its Results”, High Energy Phys. and Nucl. Phys. (in Chinese) 19, 82-86 (1995).
  44. L. Yuan, Z. Fan, G. Yin, K. Yi, J. Shao, M. Cui, L. Liu, J. Miao, G. Chen and X. Shao, “Development and Optical Performance of Soft X-ray Multilayer Phase Laminar Grating”, Acta Optica Sinica (in Chinese) 14(6), 642-645 (1994).
  45. J. Miao, M. Cui and E. Tang, “The Factors of Interfering with Reflectivity of Multilayer Mirrors in the Soft X-ray Region”, in X-ray Microscopy IV ( eds. by V. V. Aristov & A. I. Erko) 573-577 (Bogorodskii, Pechatnik, 1994).
  46. J. Miao, M. Cui, E. Tang and L. Xiu, “Thickness Measurement of Non-Transparent Dielectric Thin Films by Using an Ellipsometer”, Opt. Mech. Eng. (in Chinese) 41, 135-140 (1992).

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