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\citation{CMS_TRIG_TDR}
\citation{CMS_CSC_RESULTS}
\citation{CSC_PRIM_1999}
\citation{CMS_MUON_TDR}
\citation{CFEB_RAD_2001}
\citation{CFEB_1998}
\citation{COMP_TESTS_1999}
\@writefile{toc}{\contentsline {section}{\numberline {1}Introduction}{2}}
\@writefile{lof}{\contentsline {figure}{\numberline {1}{\ignorespaces A block diagram of the electronics associated with each CSC muon chamber of CMS. There are 9 TMB/DMB board pairs per crate (not shown).}}{2}}
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\citation{AFEB2001}
\citation{CMS_TRIG_TDR}
\citation{CMS_TRIG_TDR}
\citation{CMS_TRIG_TDR}
\citation{CCB_2002}
\citation{TTC_1997}
\citation{CMS_MUON_TDR}
\citation{CMS_MUON_TDR}
\@writefile{toc}{\contentsline {section}{\numberline {2}ALCT, CLCT, and TMB Trigger Algorithms}{3}}
\@writefile{toc}{\contentsline {subsection}{\numberline {2.1}ALCT Algorithm}{3}}
\@writefile{toc}{\contentsline {subsection}{\numberline {2.2}CLCT Algorithm}{4}}
\@writefile{toc}{\contentsline {subsection}{\numberline {2.3}ALCT-CLCT Match Algorithm}{4}}
\@writefile{toc}{\contentsline {section}{\numberline {3}Test Beam Setup}{5}}
\@writefile{toc}{\contentsline {subsection}{\numberline {3.1}Data-taking Conditions}{5}}
\@writefile{toc}{\contentsline {subsection}{\numberline {3.2}X5A Setup}{5}}
\@writefile{lof}{\contentsline {figure}{\numberline {2}{\ignorespaces  The summer 2003 CSC test beam setup. The beam line is vertical and passes through two CSC chambers that are mounted on the left (one is hidden behind the other). Blue cables run along the top from the on-chamber electronics to the right side where the peripheral crate electronics is located in a 9U-height VME crate. The peripheral crate electronics is then read out through an optical fiber to a PCI card, and thence to disk in the data acquisition computer in the control room. }}{6}}
\newlabel{tb03_pic}{{2}{6}}
\@writefile{lof}{\contentsline {figure}{\numberline {3}{\ignorespaces An event display showing the anode hits versus time and wire number for each chamber layer.}}{7}}
\newlabel{alct_display}{{3}{7}}
\@writefile{lof}{\contentsline {figure}{\numberline {4}{\ignorespaces An event display showing profiles of the cathode hit data versus strip number (left) and time bin (right).}}{8}}
\newlabel{clct_display}{{4}{8}}
\@writefile{lof}{\contentsline {figure}{\numberline {5}{\ignorespaces An event display showing the maximum cathode charge recorded on each strip (top) and the anode wires that recorded hits (bottom). The six layers of the CSC chambers are shown.}}{9}}
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\@writefile{toc}{\contentsline {section}{\numberline {4}Trigger Setup and Timing}{10}}
\@writefile{lof}{\contentsline {figure}{\numberline {6}{\ignorespaces ALCT delay scans for chamber 1 (left) and chamber 2 (right). The efficiency for identifying the `correct' bunch crossing is shown versus the ALCT fine delay setting. (Settings 0-15 are available in $2.2$\nobreakspace  {}ns steps.}}{10}}
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\@writefile{toc}{\contentsline {section}{\numberline {5}Results}{11}}
\@writefile{toc}{\contentsline {subsection}{\numberline {5.1}Digital Comparison of Pattern-finding Simulation to LCTs}{11}}
\@writefile{toc}{\contentsline {subsection}{\numberline {5.2}Trigger Primitives Efficiency}{11}}
\@writefile{toc}{\contentsline {subsection}{\numberline {5.3}High Voltage and Threshold Scans}{11}}
\@writefile{toc}{\contentsline {subsection}{\numberline {5.4}Bunch Crossing Identification}{11}}
\@writefile{toc}{\contentsline {subsection}{\numberline {5.5}Trigger Primitives Position Resolution}{11}}
\@writefile{toc}{\contentsline {subsubsection}{\numberline {5.5.1}Describe Stan's precision fitting algorithm}{11}}
\@writefile{toc}{\contentsline {subsubsection}{\numberline {5.5.2}Single Chamber Results}{11}}
\@writefile{lof}{\contentsline {figure}{\numberline {7}{\ignorespaces ALCT and CLCT efficiencies versus chamber high voltage.}}{12}}
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\@writefile{lof}{\contentsline {figure}{\numberline {8}{\ignorespaces Bunch crossing with muon particles within the orbit containing 924\nobreakspace  {}bunch crossings. On the top is shown the bunch crossings identified with the scintillator hodoscope. On the bottom is shown the bunch crossings as identified by the ALCT circuitry.}}{13}}
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\@writefile{lof}{\contentsline {figure}{\numberline {9}{\ignorespaces This is a placeholder for a future figure.}}{14}}
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\@writefile{toc}{\contentsline {subsubsection}{\numberline {5.5.3}Two-chamber plots}{14}}
\@writefile{toc}{\contentsline {subsection}{\numberline {5.6}Chamber Angle Scans}{14}}
\@writefile{lof}{\contentsline {figure}{\numberline {10}{\ignorespaces The CLCT `key' half-strip found in the two chambers plotted against each other. The top plot shows all half-strips (0-159), while the bottom plot zooms in on the position where the beam is defined by the scintillator hodoscope.}}{15}}
\newlabel{clct_key_vs_key}{{10}{15}}
\@writefile{lof}{\contentsline {figure}{\numberline {11}{\ignorespaces CLCT efficiency versus rotation angle $\phi _b$.}}{16}}
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\@writefile{lof}{\contentsline {figure}{\numberline {12}{\ignorespaces CLCT qualities versus pattern numbers, for half-strip patterns (left) and di-strip patterns (right), for rotation angle $\phi _b=0^o$.}}{16}}
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\@writefile{lof}{\contentsline {figure}{\numberline {13}{\ignorespaces CLCT qualities versus pattern numbers, for half-strip patterns (left) and di-strip patterns (right), for rotation angles $\phi _b=-2.5^o$ (top) and $\phi _b=+2.5^o$ (bottom).}}{17}}
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\@writefile{toc}{\contentsline {section}{\numberline {6}Conclusions}{20}}
\@writefile{lof}{\contentsline {figure}{\numberline {19}{\ignorespaces CLCT qualities versus pattern numbers, for half-strip patterns (left) and di-strip patterns (right), for rotation angles $\phi _b=-25^o$ (top) and $\phi _b=+25^o$ (bottom).}}{21}}
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\bibcite{CMS_MUON_TDR}{1}
\bibcite{CMS_TRIG_TDR}{2}
\bibcite{CMS_CSC_RESULTS}{3}
\bibcite{CSC_PRIM_1999}{4}
\bibcite{CFEB_RAD_2001}{5}
\bibcite{CFEB_1998}{6}
\bibcite{COMP_TESTS_1999}{7}
\bibcite{AFEB2001}{8}
\bibcite{CCB_2002}{9}
\bibcite{TTC_1997}{10}
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